Area time-of-flight sensor scans the world in 3D

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Onsemi ToF area depth sensor

“By using proprietary global shutter pixel architecture and on-board storage, the Hyperlux ID family can capture an entire scene and simultaneously process depth measurement in real-time,” according to the company. “This approach enables depth sensing up to 30 meters. Additionally, the sensor family is capable of producing both monochrome images and depth information at the same time. By combining these two outputs, the sensor can provide a comprehensive view of the environment without requiring separate sensors.”

Optically, they are 5.6mm (‘1/3.2 inch’) 1,280 x 960 arrays of 3.5μm pixels.

On-board is timing circuity intended to trigger one or more external laser diodes (VCSELs) at modulation frequencies up to 200MHz.


Depth is measured from the phase shift of the reflected laser light. “The proprietary pixel architecture enables the sensors to capture and store four different phases of light simultaneously in one exposure, capturing the entire scene and enhancing depth measurement accuracy,” said the company.

To reduce noise from ambient infra-red sources, a global shutter is provided to align all sensor pixels with the laser(s).

There are two sensors:

AF0130 has the sensing array as well as a depth processing asic stacked below the pixel plane to calculate depth, confidence and intensity maps at high speed.

AF0131 is for combining with off-chip depth calculation. It has the same optical performance, but no processing asic.

For further information, find Onsemi in hall 4A on stand 260 at Embedded World in Nuremberg this week, or take a look at this product page. Access to the full data sheet requires an NDA.





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